Analysis of mass spectrograph ion beam input. Finite element analysis project report.

摘要

A Spark-Source Mass Spectrograph (SSMS) has been used at NDD for 20 years to analyze the composition of many conductive materials. The sample is placed inside the SSMS where a spark gap ionizes it through an arc generated when an rf field is passed through it. The ions are then accelerated to the detector portion of the SSMS for analysis. This set-up has worked very well in the past. However, insulators cannot be tested by this method. Therefore another method for testing had to be devised. A modification has been made to the SSMS by coupling it to a Nd:YAG Laser. The laser gives the SSMS the capability to make analyses of insulators. The system encloses a sample inside a hollow can with a slit cut in the center and a quartz window on the side. Figure 1 shows a cross section of the can in relation to the laser and the input path to the spectrograph.