Increased stuck-at fault coverage with reduced I(sub DDQ) test sets

摘要

Simplified ATPG and fault simulation algorithms, reduced test set sizes, and increased fault coverage are achieved with I (sub DDQ) testing for stuck-at faults. In addition, I (sub DDQ) testing will detect logically redundant and multiple stuck-at faults, and improve the detection of non-stuck-at fault defects. 17 refs., 6 figs., 6 tabs.