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Hybrid scan-based delay testing technique for compact and high fault coverage test set
Hybrid scan-based delay testing technique for compact and high fault coverage test set
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机译:基于混合扫描的延迟测试技术,用于紧凑且高故障覆盖率的测试仪
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摘要
A scan-based method for testing delay faults in a circuit comprising controlling a subset of state inputs of the circuit by a skewed-load approach and controlling all inputs other than said subset of state inputs by a broad-side approach.
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