首页> 美国政府科技报告 >Materials science applications of a 120 kV FEG TEM/STEM: Triskaidekaphilia.

【24h】

Materials science applications of a 120 kV FEG TEM/STEM: Triskaidekaphilia.

机译：120 kV FEG TEm / sTEm的材料科学应用：Triskaidekaphilia。

获取原文

页面导航

摘要
著录项
相似文献
相关主题

摘要

The introduction by several manufacturers of 200kV transmission electron microscopes (TEM) equipped with field emission guns affords the opportunity to assess their potential impact on materials science by examining applications of similar 100-120kV instr ...

著录项

作者
J. Bentley A. T. Fisher E. A. Kenik Z. L. Wang;
展开▼
作者单位

展开▼
年度 1991
页码 1-4
总页数 4
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Crystal Lattices; EDB/400102; EDB/656002; Electron Microscopes; Energy-Loss Spectroscopy; Field Emission; Ion Microscopy; KeV Range 100-1000; Materials; Materials testing; Meetings; Order Parameters; Physical Radiation Effects; Quantitative Chemical Analysis; Scanning Electron Microscopy; Stainless Steels; Transmission Electron Microscopy; Uses; X-Ray Spectroscopy;

机译：晶体晶格; EDB / 400102; EDB / 656002;电子显微镜;能量损失光谱;场发射;离子显微镜; KeV范围100-1000;材料;材料测试;会议;订单参数;物理辐射效应;定量化学分析;扫描电子显微镜;不锈钢;透射电子显微镜;用途; X射线光谱;

相似文献

外文文献
中文文献
专利

1. Performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto University [J] . Hua Jiang, Janne Ruokolainen, Neil Young, Micron: The international research and review journal for microscopy . 2012,第4期

机译：阿尔托大学多功能双像差校正后的JEOL-2200FS FEG TEM / STEM的性能和早期应用
2. Orientation and phase mapping in TEM microscopy (EBSD-TEM like): Applications to materials science [J] . Rauch E.F., Veron M., Nicolopoulos S., Diffusion and Defect Data. Solid State Data, Part B. Solid State Phenomena . 2012,第Null期

机译：TEM显微镜（EBSD-TEM的定位和相位映射）：材料科学的应用
3. Recent advances in electron tomography: TEM and HAADF-STEM tomography for materials science and semiconductor applications [J] . Kubel C, Voigt A, Schoenmakers R, Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2005,第5期

机译：电子层析成像技术的最新进展：TEM和HAADF-STEM层析成像技术，用于材料科学和半导体应用
4. Orientation and phase mapping in TEM microscopy (EBSD-TEM like): applications to materials science [C] . Edgar F. Rauch, Muriel Veron, Stavros Nicolopoulos, International Conference on Electron Microscopy . 2012

机译：TEM显微镜（EBSD-TEM的阶段映射（EBSD-TEM）：材料科学的应用
5. 2D and 3D TEM Imaging on Nano-materials for Energy Application. [D] . Li, Jing. 2014

机译：用于能源应用的纳米材料上的2D和3D TEM成像。
6. Applications of the Crystallographic Search and Analysis System CRYSTDAT in Materials Science [O] . T. Siegrist 1989

机译：晶体学搜索分析系统CRYSTDAT在材料科学中的应用
7. Improvement of a 40-120 kV analytical TEM system for electron beam irradiation sensitive nano materials [O] . Toshie Yaguchi, Keiji Tamura, Takashi Kubo, 2016

机译：用于电子束照射敏感纳米材料40-120 kV分析TEM系统的改进

Materials science applications of a 120 kV FEG TEM/STEM: Triskaidekaphilia.

摘要

著录项

相似文献

相关主题

期刊订阅