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SEU response of design- and resistor-hardened D-latches in the SA3300 microprocessor.

机译：sa3300微处理器中的设计和电阻硬化D锁存器的sEU响应。

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The effectiveness of hardening the SA3300 against SEU using design and design-plus-resistor approaches is presented. The full performance and SEU tolerance requirements are met using R(sub fb) (le) 160 k(Omega). Lumped-parameter circuit simulations are us ...

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作者
F. W. Sexton W. T. Corbett C. L. Axness T. F. Wunsch K. L. Hughes;
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年度 1991
页码 1-7
总页数 7
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Computerized Simulation; Design; EDB/440200; Feedback; Microprocessors; MOS Transistors; Performance; Radiation Hardening; Single event upsets; Temperature Dependence;

机译：计算机模拟;设计; EDB / 440200;反馈;微处理器; mOs晶体管;性能;辐射硬化;单事件干扰;温度依赖性;

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1. SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor [J] . Sexton F.W., Corbett W.T. IEEE Transactions on Nuclear Science . 1991,第6期

机译：SA3300微处理器中电阻硬化D型闩锁的SEU模拟和测试
2. SEU characterization and design dependence of the SA3300 microprocessor [J] . Sexton F.W., Treece R.K. IEEE Transactions on Nuclear Science . 1990,第6期

机译：SA3300微处理器的SEU表征和设计依赖性
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6. SEU characterization and design dependence of the SA3300 microprocessor. [R] . Sexton, F. W., Treece, R. K., Axness, C. L., 1990

机译：sa3300微处理器的sEU特性和设计依赖性。

SEU response of design- and resistor-hardened D-latches in the SA3300 microprocessor.

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