In Situ Absolute Temperature Control of Growing Thin Films of the Complex Oxides

摘要

The Fourier Transform Infrared spectrophotometer purchased from Online Technologies, Inc. was tested and declared operational with the help of the designer from that company. Bench top tests of the sensitivity of the temperature measurement to spectral reflection and angle of acceptance were performed. Design and structural modifications were made to the electron beam evaporator in which it will be used. These are necessary to accommodate the special requirements of the instrument.