Prediction and Measurement of Induced Voltages Inside Complicated Enclosures using Wave-Chaos

摘要

This briefing looks at four questions: (1) Is there some fast, simple and accurate way to predict the voltages induced at specific points within a complicated metallic enclosure (e.g. computer-box) due to external radiation; (2) What factors determine the nature of these induced voltages; (3) Is there some 'optimally shaped' wave-form for the external radiation, for which the electronics within the enclosure is most susceptible; (4) Is it possible to engineer an enclosure to make it resistant to HPM attack.