首页> 美国政府科技报告 >Uncovering the Fundamental Nature of Tribological Interfaces: High- Resolution Tribology and Spectroscopy of Ultrahard Nanostructured Diamond Films for MEMS and Beyond; Final rept. 15 Mar 2005-31 Dec 2007
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Uncovering the Fundamental Nature of Tribological Interfaces: High- Resolution Tribology and Spectroscopy of Ultrahard Nanostructured Diamond Films for MEMS and Beyond; Final rept. 15 Mar 2005-31 Dec 2007

机译:揭示摩擦学界面的基本性质:用于mEms及其以外的超硬纳米结构金刚石薄膜的高分辨率摩擦学和光谱学;最终的评论。 2005年3月15日至2007年12月31日

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摘要

Several new and significant fundamental insights into the tribological behavior of ultrastrong carbon-based films with extremely low friction and wear have been uncovered. Specific limits on this low friction and wear behavior were elucidated. In addition, photoemission electron microscopy (PEEM) has been successfully established as a powerful tool for understanding the changes that occur due to tribological sliding. By using PEEM, atomic force microscopy, and a range of surface science techniques, the tribology of carbon- based materials has been brought to a new level of understanding. The new insights include the paradigm-shifting demonstration that the low friction of diamond films is not due to the formation of graphite at the sliding interface as widely thought, but rather due to the passivation of dangling bonds by dissociative adsorption of species such as water.

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