Characterization of Periodically Poled Nonlinear Materials Using Digital Image Processing; Interim rept. 1 Apr 2007-22 Apr 2008

摘要

For as long as periodically poled devices have been produced, there has been a need to evaluate and improve their performance. A new approach based on image processing across an entire z+ or z- surface of a poled crystal allows for better quantification of the underlying domain structure and directly relates to device performance. The poled regions are determined from the images and this mapping is then used to determine an effective nonlinear d- coefficient. Experimentally validated measurements are shown for an optical parametric generator setup. Future improvements in the poling process should be possible by using this technique to produce quantifiable metrics to compare device fabrication iterations, which has applications in Quality Assurance as well as device development.