Critical Current in YBCO Coated Conductors in the Presence of a Macroscopic Defect (POSTPRINT)

摘要

We have studied the effects of localized defects in the YBCO coated conductors on the critical current. The artificial defects were introduced into 4, 10 and 12 mm wide tapes as cuts of various lengths made either by laser ablation or mechanical means. Transport measurements were carried out in an external variable magnetic field to obtain the I-V characteristics of the damaged areas. The distribution of the magnetic field in the vicinity of the defects has been mapped as well. The reduction of the critical current by the defects, with and without an external DC magnetic field are discussed and compared with existing theories. A criterion for determining the critical current in the area containing a defect is suggested.