Gate-Level Commercial Microelectronics Verification with Standard Cell Recognition.

摘要

Within the past two decades, the problem of counterfeit hardware has gained significant attention within the Department of Defense (DoD). Counterfeit electronics compromise national security systems as they may fail to meet durability requirements and/or contain malicious circuits [6, 16, 17]. This necessitates the development of methods to detect counterfeit electronics and prevent the counterfeit electronics from entering DoD systems. The DARPA TRUST program was established to address the need to verify integrated circuit (IC) electronics. This research describes the development of standard cell recognition (SCR) software intended to resolve conflicts in prior TRUST related applications of commercial software to verify IC designs. SCR software applications to circuits composed of up to 650 transistors are presented, and the resulting 90% SCR application success rate is discussed.