将本页翻译成中文
您现在的位置:首页> 美国政府科技报告 >文献详情

【6h】 Multi-Core Memory Module DC Tester

【摘要】The system described was designed to provide an automatic D.C. testing device for use with the multicore assemblies used in Satellite memory assemblies. Unitl now, these assemblies were tested by hand, a rather cumbersome task. Each assembly consists of from 3 to 160 cores, each with several windings, as well as several common windings which traverse the whole assembly of cores. It is very important that each core have an exact ratio of turns for proper operation, thus, for a D.C. test, the system must be extremely sensitive to small changes in resistance. This unit is designed to test all multicore assemblies by changing a programming panel for each different type. Although somewhat limited in its application, because of the reasons outlined in the summary, it does provide a sensitive resistance check of these assemblied. The report describes its operation as assembled presently. (Author)

【作者】Locke, C. D.;

【作者单位】Johns Hopkins Univ Silver Spring Md Applied Physics Lab;

【年(卷),期】1963(),

【年度】1963

【页码】p.1-53

【总页数】53

【原文格式】PDF

【正文语种】eng

【中图分类】;

【关键词】Computer storage devices ;Test sets ;Automatic ;Direct current ;Data storage systems ;Power supplies ;Voltmeters ;Scanning ;Recording systems ;Panel boards(Electricity) ;Test equipment(Electronics);

  • 相关文献

联系方式:18141920177 (微信同号)

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-1 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号