Computer Algorithm for Fault Isolation and Test Point Selection

摘要

This report presents the methods and results of a study to develop a computer algorithm for automatically selecting test point locations in an electronic circuit, for generating test measurements, and for designing a corresponding test procedure. The algorithm is oriented towards analog circuits where piece-part fault isolations are made using sequential tests which can be performed either manually or on tape-controlled automatic test equipment. The algorithm was tested by introducing faults into the test circuit and then tests were made in accordance with the computer generated test procedure. The correct faults were selected and no false indications were present. The output from the computer program includes (1) a specification of necessary testpoint locations and (2) a sequential test procedure including measured nominal values and test limits under both good and faulty circuit conditions. (Author)