首页> 美国政府科技报告 >High Voltage Breakdown Study. Addendum: Some Factors and Associated Mechanisms Influencing High Voltage Insulation Failure in Vacuum
【24h】

High Voltage Breakdown Study. Addendum: Some Factors and Associated Mechanisms Influencing High Voltage Insulation Failure in Vacuum

机译:高压击穿研究。附录:影响真空中高压绝缘失效的因素及相关机制

获取原文

摘要

An experimental program has been initiated to study dc breakdown in vacuum up to 300 kV without reliance upon preconceived convictions of what are the mechanisms or participating factors. A range of possible factors previously reported to be influential in determining vacuum breakdown voltage was chosen with a view to studying their effects and interactions using the techniques of factorial experimental design. These methods are particularly useful in complex problems of applied physics in which many well understood fundamental physical processes operate simultaneously but with varying degrees of significance. The nature of the vacuum breakdown mechanism presents just such a problem and the relative significance or total absence of several processes may be inferred from the results. A wide selection of physical monitoring techniques has also been employed to collect supplementary data from which some basic theoretical ideas of the possible breakdown mechanism were developed. These ideas have been analyzed in detail, leading to a mathematical theory of the breakdown mechanism. The theory not only explains the experimental data satisfactorily but also extends naturally into other operating regimes. Previously reported laws relating breakdown voltage and gap separation appropriate to cathode or anode dominated conditions have been confirmed and explained by the theory. New data on the influences of a weak magnetic field and of gas dissolved in the electrodes is presented and compares very satisfactorily with analytical predictions. A novel experimental technique was also developed for monitoring gas evolution instantaneously using the X-rays emitted as prebreakdown current accelerates through it. (Author)

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号