Integrated Circuit Electromagnetic Susceptibility Investigation - Phase 2. Test and Measurement Systems.

摘要

This report describes the RF test fixture and the semi-automatic test set up developed on contract number N00178-73-C-0362 to investigate the susceptibility of integrated circuits to high power RF signals. Some of the material contained herein has appeared in previous reports, but is also included here to provide a complete testing document. Test fixtures were fabricated to permit testing of integrated circuits with up to 16 leads on three different package styles (flat-pack, dual in-line, and TO-5 can) while fully biased and operational. The semi-automatic test system was developed to facilitate collecting the enormous amount of data needed for the integrated circuit susceptibility investigation. The heart of the system is an HP9810A programmable calculator and a 50-channel scanning digital voltmeter; however, several circuits had to be designed and fabricated to aid in biasing and loading the IC and to interface with the computer.