Accessibility of Large-Scale Electronic Circuits

摘要

The problem of fault diagnosis of large-scale analog circuit is studied. Any fault diagnosis procedure is limited by the number of circuit parameters to be diagnosed. When such limit is exceeded by large-scale circuits, some kind of tearing process has to be implemented before a fault diagnosis procedure can be applied. In this paper, a tearing process via accessibility of subnetworks is presented. The necessary and sufficient condition for accessibility is obtained. The implementation of this tearing process is discussed. The tearing process can be applied to nonlinear circuits. (Author)