Experimental Evaluation of Peak Height Approximation for X-Ray Diffracted Integrated Intensity Method.

摘要

A method for characterizing an unresolved characteristic X-ray K sub alpha diffracted powder peak with respect to integrated intensity and Bragg angle has been tested. The method assumes the upper half of the diffracted peak to be Gaussian and the bottom half a Cauchy functional shape to match the experimentally measured diffraction peak. The peak height is used to compute the integrated intensity using calculated relationships. The integrated intensities of the Cuk sub alpha (111) and (200) X-ray diffracted peak doublets were measured from silicon powders employing variations in beam and receiving slit widths on commercial X-ray units and compared with the calculated intensities. This method offers promise as a fast and accurate technique as demonstrated by its ability to measure X-ray intensities to a precision of several percent under selective experimental conditions. (Author)