Life Distribution Properties of Devices Subject to a Levy Wear Process.

摘要

Assume that a device is subject to wear. Over time the wear is assumed to be an increasing Levy process. Suppose the device has a threshold with right-tail probability G. Let Zeta be the failure time of the device and F sub x be its survival probability given that X sub O = x. It is shown that life distribution properties of G are inherited as corresponding properties of F sub x. Optimal replacement policies for such devices are discussed for suitably chosen cost functions when the failure rate of G is bounded and continuous a.e. on the support of G.