Functional Testing of LSI/VLSI Based Systems with Measure of Fault Coverage

摘要

Functional testing is a feasible solution for LSI/VLSI test generation and design verification. In this paper, we present a systematic way to perform functional testing using an advanced symbolic execution technique. Symbolic execution is a very useful and powerful software engineering technique mainly used in program analysis including test generation. Often a single symbolic execution of a program may represent a large number of normal test runs.