首页> 美国政府科技报告 >Study of Relaxation Techniques for the Transient Analysis of Digital Circuits
【24h】

Study of Relaxation Techniques for the Transient Analysis of Digital Circuits

机译:数字电路瞬态分析的弛豫技术研究

获取原文

摘要

In the VLSI microelectronics era, the cost of the immense CPU time and memory storage for a 'standard' circuit simulator has become prohibitive. In order to achieve dramatic improvement in the performance of the circuit simulator, there are two principal points of departure from the 'standard' simulation approach, namely, 'tearing' decomposition and 'relaxation' decomposition. This research is to study the numerical convergence and stability properties of several of the relaxation algorithms that have been proposed for the simulation of VLSI circuits. The time-point Gauss-Seidel method with prediction, the exploitation of latency and event scheduling algorithms are implemented into a general purpose circuit simulator SLATE-R (a Simulator with Latency and Tearing --Relaxed version). The performance of the SLATE-R program in the analysis of various types of integrated circuit technologies is studied. Keywords include: Microelectronics, standard, tearing, relaxation, decomposition, and exploitation.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号