Detecting Bridging Faults with Stuck-at Test Sets

摘要

Simulations run on sample circuits show that extremely high detection of bridging faults is possible using modifications of psuedo-exhaustive test sets. Real chips often contain bridging faults, and this research shows that stuck-at test sets are not sufficient for detecting such faults. The modified pseudo-exhaustive test sets are easy to generate and require little, or no, fault simulation. Criteria have been found for identifying bridging faults unlikely to be detected by test sets. Techniques for increasing the bridging fault coverage of test sets without consuming excessive computer time are suggested.