Electro-Optic Characterisation of Extremely Wide Bandwidth Electrical Signals.

摘要

In this report an ultrafast electro-optic sampling system suitable for applications such as device characterisation is described. The aperture time of the sampler is calculated to be about 290 fs, implying an attainable device bandwidth in excess of 300 GHz. The sampler was characterised using a test pulse with approximately 12 GHz of frequency content, and the results compared to those obtained from an 18 GHz digital sampling oscilloscope. Signal Processing, Bandwidth, Frequencies, Oscilloscopes.