Scanning Tunneling Microscopy/Atomic Force Microscopy for Study of NanoscaleMetal Oxide Particles (Destructive Adsorbents)

摘要

A modern scanning tunneling microscopy/atomic force microscopy instrument waspurchased. This instrument is allowing physical characterization of nanoscale particles of metal oxides. These particles are known to be effective reagents for the destruction of military toxins as well as chlorocarbons by a process we call destructive adsorption. Nanoscale particles, Destructive adsorption, Atomic force microscopy, Scanning, Tunneling, Scanning probe.