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首页> 外文期刊>Physica, E. Low-dimensional systems & nanostructures >Back-illuminated silicon resonant cavity-enhanced photodetector at 1550 nm
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Back-illuminated silicon resonant cavity-enhanced photodetector at 1550 nm

机译:1550 nm的背照式硅谐振腔增强光电探测器

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摘要

In this paper a novel photodetector at 1550 nm, working at room temperature and completely silicon compatible, is reported. The detector is a resonant cavity-enhanced structure incorporating a Schottky diode back-illuminated and its working principle is based on the internal photoemission effect. The device performances in terms of responsivity are numerically calculated for different values of bottom reflectivity. Finally, a preliminary device was realized and characterized in order to validate the theoretical results.
机译:本文报道了一种新型的1550 nm光电探测器,该探测器在室温下工作并且与硅完全兼容。该探测器是一种谐振腔增强结构,结合了肖特基二极管的背照式,其工作原理基于内部光发射效应。对于底部反射率的不同值,以数值方式计算了器件的响应度。最后,实现并表征了初步设备,以验证理论结果。

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