Estimation of the density of localized states of a-Se100-xBix films from electrical properties

摘要

The density of states (DOS) near the Fermi level is calculated using DC conductivity (Mott parameters) and Space Charge Limited Conduction (SCLC) measurement data. DC conductivity measurements on thin films of a-Se100-xBix (x = 0, 0.5, 2.5 and 5) are reported in the temperature range 219-375 K. At high temperature 249-375 K, the conduction occurs in the extended states while at lower temperature (219-249 K) the conduction is due to variable range hopping. I-V measurements have also been done on a-Se100-xBix at different electric fields. SCLC is observed in a-Se100-xBix. (C) 2002 Published by Elsevier Science B.V. [References: 42]