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Observation of picosecond electron spin relaxation in InGaAsP by time-resolved spin-dependent pump and probe reflection measurement

机译:通过时间分辨自旋相关泵和探针反射测量观察InGaAsP中皮秒电子自旋弛豫

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摘要

We have investigated the electron spin relaxation in undoped InGaAsP grown on an InP substrate. Time-resolved spin-dependent pump and probe reflection measurements revealed a spin relaxation behavior between 10 and 300K. We have observed the electron spin relaxation times of 980ps at 10K and 95ps at room temperature. The observed presence of the carrier density dependence and the weak temperature dependence of spin relaxation time imply that the Bir-Aronov-Pikus (BAP) process is effective at 10-30K. At 100-300K, the observed presence of the temperature dependence and the absence of the carrier density dependence of spin relaxation time indicate that the D'yakonov-Perel' (DP) and Elliott-Yafet (EY) processes are effective. (C) 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
机译:我们已经研究了在InP衬底上生长的未掺杂InGaAsP中的电子自旋弛豫。时间分辨自旋相关的泵浦和探针反射测量显示自旋弛豫行为在10到300K之间。我们已经观察到10K时电子自旋弛豫时间为980ps,室温下为95ps。观察到的载流子密度依赖性和自旋弛豫时间的弱温度依赖性的存在暗示着Bir-Aronov-Pikus(BAP)过程在10-30K时有效。在100-300K,观察到的温度依赖性和自旋弛豫时间的载流子密度依赖性的缺乏表明D'yakonov-Perel'(DP)和Elliott-Yafet(EY)过程是有效的。 (C)2015 WILEY-VCH Verlag GmbH&Co.KGaA,Weinheim

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