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Role of the deposition parameters in the uniformity of films produced by the plasma-enhanced chemical vapour deposition technique

机译:沉积参数在通过等离子体增强化学气相沉积技术生产的薄膜均匀性中的作用

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摘要

The objective of this work is to present an analytical model able to interpret the experimental dependence of the uniformity of films produced by the plasma-enhanced chemical vapour deposition technique on the deposition parameters (discharge pressure, gas Bow temperature and rf power density). The model proposed is based on the Navier-Stokes equations applied to a gas flow considered to be quasi-incompressible and quasi-inviscous, whenever the Mach number is below 0.3. This condition leads to the establishment of the proper quasisteady-state gas Bow equations, and the corresponding equations of energy and momentum balance ascribed to the mass profile of the species formed, under the presence of a low-rf-power plasma density, are able to predict the uniformity distribution of the film over the entire deposited substrate area.
机译:这项工作的目的是提供一个分析模型,该模型能够解释由等离子体增强化学气相沉积技术生产的薄膜的均匀性对沉积参数(排放压力,气体弓形温度和射频功率密度)的实验依赖性。提出的模型基于适用于气流的Navier-Stokes方程,只要马赫数低于0.3,该气流就被认为是准不可压缩和准不粘稠的。这种情况导致建立了适当的准稳态气体Bow方程,并且在低rf功率等离子体密度的存在下,对应于所形成物质的质量分布的能量和动量平衡方程能够以预测膜在整个沉积的基材区域上的均匀分布。

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