...
首页> 外文期刊>Pattern recognition and image analysis: advances in mathematical theory and applications in the USSR >On Metric Spaces Arising during Formalization of Recognition and Classification Problems. Part 1: Properties of Compactness
【24h】

On Metric Spaces Arising during Formalization of Recognition and Classification Problems. Part 1: Properties of Compactness

机译:关于识别和分类问题形式化过程中出现的度量空间。第1部分:紧凑性

获取原文
获取原文并翻译 | 示例
           

摘要

In the context of the algebraic approach to recognition of Yu.I. Zhuravlev’s scientific school, metric analysis of feature descriptions is necessary to obtain adequate formulations for poorly formalized recognition/classification problems. Formalization of recognition problems is a cross-disciplinary issue between supervised machine learning and unsupervised machine learning. This work presents the results of the analysis of compact metric spaces arising during the formalization of recognition problems. Necessary and sufficient conditions of compactness of metric spaces over lattices of the sets of feature descriptions are analyzed, and approaches to the completion of the discrete metric spaces (completion by lattice expansion or completion by variation of estimate) are formulated. It is shown that the analysis of compactness of metric spaces may lead to some heuristic cluster criteria commonly used in cluster analysis. During the analysis of the properties of compactness, a key concept of a ρ-network arises as a subset of points that allows one to estimate an arbitrary distance in an arbitrary metric configuration. The analysis of compactness properties and the conceptual apparatus introduced (ρ-networks, their quality functionals, the metric range condition, i- and ρspectra, ε-neighborhood in a metric cone, ε-isomorphism of complete weighted graphs, etc.) allow one to apply the methods of functional analysis, probability theory, metric geometry, and graph theory to the analysis of poorly formalized problems of recognition and classification.
机译:在代数方法的上下文中识别Yu.I. Zhuravlev的科学学院,对特征描述进行度量分析对于获得形式化不佳的识别/分类问题的适当公式是必要的。识别问题的形式化是有监督的机器学习与无监督的机器学习之间的跨学科问题。这项工作介绍了在识别问题的形式化过程中产生的紧凑度量空间的分析结果。分析了特征描述集的格上度量空间紧凑性的充要条件,并提出了完成离散度量空间(通过晶格扩展完成或通过估计变化完成)的方法。结果表明,度量空间紧凑性的分析可能会导致一些通常用于聚类分析的启发式聚类标准。在分析紧凑性的过程中,ρ网络的一个关键概念作为点的子集出现,它允许人们估计任意度量配置中的任意距离。分析紧致特性和引入的概念设备(ρ网络,其质量功能,度量范围条件,i和ρ谱,度量圆锥中的ε邻域,完全加权图的ε同构等)允许一个将功能分析,概率论,度量几何和图论的方法应用于识别和分类不规范的问题。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号