首页> 外文期刊>Surface review and letters >Effects of substrate temperature on structural, optical and surface morphological properties of pulsed laser deposited ZnO thin films
【24h】

Effects of substrate temperature on structural, optical and surface morphological properties of pulsed laser deposited ZnO thin films

机译:衬底温度对脉冲激光沉积ZnO薄膜的结构,光学和表面形态特性的影响

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

The effect of substrate temperature on the structural, optical and morphological properties of ZnO thin films has been investigated. ZnO thin films were deposited on quartz substrate for various temperatures ranging from room temperature to 250°C by pulsed laser deposition (PLD) technique. Nd:YAG laser (532 nm, 100 mJ, 6 ns, 10 Hz) with corresponding fluence of 6 J/cm ~2 was employed for the ablation of ZnO target. Characterization of the thin films was carried out using X-ray diffraction (XRD), high resolution UV-visible spectrometer, atomic force microscope (AFM) and scanning electron microscope (SEM). From XRD analysis, the amorphous behaviors of films at room temperature and crystalline behavior along the preferred orientation of (002) is exhibited for higher substrate temperature. The transmittances of grown films increase with the increasing substrate temperature. The evaluated values of bandgap energies increase with increasing substrate temperature up to the range of 150°C and then monotonically decrease with the further increase in temperature. AFM and SEM analysis illustrates that the density and height of grains for deposited films increase significantly with increasing substrate temperature.
机译:研究了衬底温度对ZnO薄膜的结构,光学和形态特性的影响。 ZnO薄膜通过脉冲激光沉积(PLD)技术在室温到250°C的各种温度下沉积在石英基板上。烧蚀ZnO靶材采用Nd:YAG激光(532 nm,100 mJ,6 ns,10 Hz),相应的注量为6 J / cm〜2。使用X射线衍射(XRD),高分辨率紫外可见光谱仪,原子力显微镜(AFM)和扫描电子显微镜(SEM)对薄膜进行表征。根据XRD分析,在较高的基材温度下,薄膜在室温下的非晶态行为和沿(002)的最佳取向的晶体行为表现出来。生长的薄膜的透射率随衬底温度的升高而增加。带隙能量的评估值随着衬底温度的升高而升高,直至达到150°C,然后随着温度的进一步升高而单调降低。 AFM和SEM分析表明,沉积膜的晶粒密度和高度随着基材温度的升高而显着增加。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号