Test and evaluation of reference-based nonuniformity correction methods for microbolometer infrared detectors

摘要

In the paper, reference-based nonuniformity correction methods for microbolometer infrared detectors are discussed and tested. In order to evaluate their effectiveness, a complete readout circuit for amorphous silicon microbolometer focal plane array has been designed. The tests were carried out on a developed stand including several extended blackbodies. Some modification of standard two-point correction algorithm incorporating detectors response at external shutter to compensate offset drift is also proposed. The obtained results are presented.