首页> 外国专利> Microbolometer for infrared detector or Terahertz detector and method for manufacturing the same

Microbolometer for infrared detector or Terahertz detector and method for manufacturing the same

机译:用于红外探测器或太赫兹探测器的微测辐射热计及其制造方法

摘要

A microbolometer includes a micro-bridge structure for uncooling infrared or terahertz detectors. The thermistor and light absorbing materials of the micro-bridge structure are the vanadium oxide-carbon nanotube composite film formed by one-dimensional carbon nanotubes and two-dimensional vanadium oxide film. The micro-bridge is a three-layer sandwich structure consisting of a layer of amorphous silicon nitride base film as the supporting and insulating layer of the micro-bridge, a layer or multi-layer of vanadium oxide-carbon nanotube composite film in the middle of the micro-bridge as the heat sensitive and light absorbing layer of the microbolometer, and a layer of amorphous silicon nitride top film as the stress control layer and passivation of the heat sensitive film. The microbolometer and method for manufacturing the same can overcome the shortcomings of the prior art, improve the performance of the device, reduce the cost of raw materials and is suitable for large-scale industrial production.
机译:微测辐射热计包括用于冷却红外或太赫兹检测器的微桥结构。微桥结构的热敏电阻和吸光材料是由一维碳纳米管和二维氧化钒膜形成的氧化钒-碳纳米管复合膜。微桥是三层夹心结构,由一层非晶硅氮化硅基膜作为微桥的支撑和绝缘层,中间是一层或多层的氧化钒-碳纳米管复合膜其中,微桥作为微测辐射热计的热敏和光吸收层,以及一层无定形氮化硅顶膜作为应力控制层和热敏膜的钝化层。本发明克服了现有技术的不足,提高了装置的性能,降低了原材料成本,适用于大规模工业生产。

著录项

  • 公开/公告号US2011315981A1

    专利类型

  • 公开/公告日2011-12-29

    原文格式PDF

  • 申请/专利权人 XIANGDONG XU;YADONG JIANG;

    申请/专利号US201113168467

  • 发明设计人 XIANGDONG XU;YADONG JIANG;

    申请日2011-06-24

  • 分类号H01L31/101;H01L31/18;

  • 国家 US

  • 入库时间 2022-08-21 17:30:04

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