Twodimensional infrared scanning microscopy images of microstructured surface patterns in an organic transistor device with metal electrode stripes on a polymer channel layer have been demonstrated. A compact single mode optical fiber scan ning probe which has a micro domeshape lens at the tip end was used for the scanning in which reflected beam intensities are coupled back to the optical fiber transceiver depending on the returned power of the sample material. Based on the ex periment, the obtained structural dimensions of the micro structure specimen were well matched to the designed ones. These images were compared to the digital microscopy photos for a potential usage to conduct not only the in situ microscopic elec trode pattern monitoring of the device but also to nondestructively investigate any surface reflecting material in micrometer scales.
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