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Organic Mip-diodes by p-doping of amorphous wide-gap semiconductors: CV and impedance spectroscopy

机译:通过对非晶宽禁带半导体进行p掺杂实现有机Mip二极管:CV和阻抗谱

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摘要

Organic thin film materials are widely investigated for applications in electronic and optoelectronic devices. For OLEDs with low operation voltage, controlled doping of the charge transport layers is particularly important. We have recently shown that starburst like amorphous materials (m-MTDATA) can be doped by strong molecular acceptors like F_4-TCNQ (tetrafluoro-tetracyano-quinodimethane). These amorphous materials have the advantage of being stable up to 100 deg C and forming smooth surfaces. Very well blocking Mip-type Schottky structures (rectification ratio 10~4-10~5) allow to determine doping profiles using CV (capacitance-voltage) spectroscopy. The interface between the doped and the undoped layer can clearly seen as an abrupt change of the capacitance. The impedance spectra can be understood in terms of an equivalent circuit model. The deduced parameters agree well with the nominal thicknesses of the I-and the p-layer and the independently measured bulk conductivity.
机译:对有机薄膜材料进行了广泛的研究,以用于电子和光电设备。对于具有低工作电压的OLED而言,电荷传输层的受控掺杂尤为重要。我们最近发现,像爆炸一样的非晶态材料(m-MTDATA)可以被强分子受体(如F_4-TCNQ(四氟-四氰基-喹二甲烷))掺杂。这些无定形材料具有在高达100摄氏度的温度下稳定并形成光滑表面的优点。密闭性良好的Mip型肖特基结构(整流比为10〜4-10〜5)允许使用CV(电容-电压)光谱法确定掺杂分布。掺杂层和非掺杂层之间的界面可以清楚地看作是电容的突变。可以根据等效电路模型来理解阻抗谱。推导的参数与I层和p层的标称厚度以及独立测量的体积电导率非常吻合。

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