Extended fine structure in characteristic X-ray fluorescence: a novel structural analysis method of condensed systems

摘要

An oscillation similar to that in extended X-ray absorption fine structure (EXAFS) is found in characteristic X-ray fluorescence spectra, originatina from a quantum interference effect during the X-ray emission process in a solid. We observe the oscillating fine structure in the radiative Auger X-ray fluorescence spectra of aluminum metal. The A1-A1 interatomic distances are successfully reproduced by the Fourier transform of the fine structure. Thus, the present method has the potential to become aconvenient alternative to EXAFS measurement for light elements.