The influence of X-ray resonant Raman scattering effects on the detection of copper(II)tetrasulphonated phthalocyanine(CuTSPc)thin-films deposited on gold electrodes

摘要

The influence of X-ray resonant Raman scattering on the detection capabilities of copper(II)tetrasulphonated phthalocyanine(CuTSPc)thin-films on gold electrodes has been investigated by means of synchrotron radiation X-ray fluorescence.In particular the paper focuses on the influence of the excitation energy in the relative narrow energy region of 9.2 to 11.7 keV on the detection limits and the peak-to-background ratios of copper.