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首页> 外文期刊>Spectrochimica Acta, Part B. Atomic Spectroscopy >Study of archaeological ceramics by total-reflection X-ray fluorescence spectrometry: Semi-quantitative approach
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Study of archaeological ceramics by total-reflection X-ray fluorescence spectrometry: Semi-quantitative approach

机译:全反射X射线荧光光谱法研究考古陶瓷:半定量方法

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Total-reflection X-ray fluorescence spectrometry has been compared with Instrumental Neutron Activation Analysis in order to test its potential application to the study of archaeological ceramics in the archaeometric field. Two direct solid non-chemical sample preparation procedures have been checked: solid sedimentation and solid chemical homogenization. For sedimentation procedure, total-reflection X-ray fluorescence allows the analysis of the elemental composition with respect to the size fraction but not the average evaluation of the composition. For solid chemical homogenization procedure, total-reflection X-ray fluorescence provides precise (from 0.8% to 27% of coefficient of variation) and accurate results (from 91 % to 110% of recovery) for 15 elements (Cr, Hf, Ni, Rb, Al, Ba, Ca, K, Mn, Ti, V, Cu, Ga, Y and Fe) with an easy sample preparation process of the solid clay and without previous chemical treatment. The influence of the particle sizes has been checked by total-reflection X-ray fluorescence sample angle scans and anomalous behaviors have been found for three additional detected elements: As, Sr and Zn, which can be attributed to interference effects of the mineral grain sizes of their associated chemical phases in the total-reflection X-ray fluorescence interference region. The solid chemical homogenization procedure produces data useful for archaeological interpretation, which is briefly illustrated by a case-study. Finally, the decantation procedure data can be also useful for size chemical speciation and, consequently, for alternative environmental total-reflection X-ray fluorescence applications.
机译:为了测试其在考古领域的考古陶瓷研究中的潜在应用,已将全反射X射线荧光光谱法与仪器中子活化分析法进行了比较。已检查了两种直接的固体非化学样品制备程序:固体沉降和固体化学均化。对于沉降过程,全反射X射线荧光允许相对于尺寸分数分析元素组成,但不能对该组成进行平均评估。对于固体化学均质化程序,全反射X射线荧光可以为15种元素(铬,H,镍, Rb,Al,Ba,Ca,K,Mn,Ti,V,Cu,Ga,Y和Fe),具有简单的固体粘土样品制备过程且无需事先化学处理。通过全反射X射线荧光样品角度扫描检查了颗粒尺寸的影响,并且发现了另外三个检测元素As,Sr和Zn的异常行为,这可归因于矿物颗粒尺寸的干扰效应全反射X射线荧光干涉区域中它们相关的化学相的分布。固体化学均质化程序会产生可用于考古解释的数据,并通过案例研究对其进行简要说明。最后,the析程序数据还可用于大小化学形态分析,因此也可用于替代性环境全反射X射线荧光应用。

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