Thin film engineering for N@C_(60) quantum computers: Spin detection and device patterning approaches

摘要

Using pulsed electrically detected magnetic resonance (p-EDMR), we measured the coherent spin evolution of about 10,000 paramagnetic states in C_(60) fullerene thin films, opening a way to study potentially single-qubit read-out mechanisms of N@C_(60) molecules. The N@C_(60) compatible, low-temperature method of spray-deposition of fullerenes on silicon substrates pre-patterned by local anodic oxidation is shown to yield fullerene structures on the 10 nm scale, still somewhat too coarse for quantum register structures, but suitable for further steps in the application of the p-EDMR method to N@C_(60).