Structural properties of K_xV_2O_5.nH_2O nanocrystalline films

摘要

X-ray diffraction (XRD), transmission electron microscope (TEM), atomic force microscope (AFM), Fourier transform infrared (FTIR) spectra and differential scanning calorimetry (DSC) were used to investigate the structure of K_xV_2O_5.nH_2O xerogel films (with 0.0 <= x < 0.0091 mol). These films were produced by the sol-gel technique. XRD as well as TEM showed that K_xO_5.nH_2O thin films are highly oriented nano-crystals. The particle size as obtained is on the average 12 nm. AFM revealed that the grain shape of the present samples is a rod-like shape. DSC showed an endothermic peak with a minimum ranging between 102 °C and 172 °C due to the intercalation of K~+ ions.