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Temperature-dependent electrical conductivity in thermally carbonized porous silicon

机译:热碳化多孔硅中随温度变化的电导率

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摘要

The temperature dependence of the electrical conductivity in thermally carbonized porous silicon has been studied. The temperature dependence of conductivity is dependent on the treatment temperature and on the thickness of the porous layer. Due to the treatment, the resistance is 10(-5) times lower in samples thermally carbonized at 850degreesC than in the as-anodized sample with the same thickness. The resistance-temperature characteristic of the thermally carbonized PSi was found to be well described by a thermistor equation and the temperature sensitivity was found to be good (5%/K at 25 degreesC). (C) 2004 Elsevier B.V. All rights reserved.
机译:已经研究了热碳化多孔硅中电导率的温度依赖性。电导率的温度依赖性取决于处理温度和多孔层的厚度。由于这种处理,在850℃下热碳化的样品的电阻比相同厚度的阳极氧化样品的电阻低10(-5)倍。发现热碳化的PSi的电阻-温度特性通过热敏电阻方程很好地描述,并且发现温度灵敏度良好(在25℃下为5%/ K)。 (C)2004 Elsevier B.V.保留所有权利。

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