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首页> 外文期刊>Sensors and Actuators, A. Physical >Simultaneous measurement of ac and dc stresses using a fibre-optic electronically scanned white-light interferometer
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Simultaneous measurement of ac and dc stresses using a fibre-optic electronically scanned white-light interferometer

机译:使用光纤电子扫描白光干涉仪同时测量交流和直流应力

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Interferometric techniques have been used extensively for the measurement of stresses in a range of industrial components. In this work, a bulk-optical Mach-Zehnder interferometer (MZI) is employed as a processing interferometer with a Fabry-Perot interferometer as the sensing head in an electronically scanned white-light interferometric sensing system. Unlike other arrangements discussed, this system can provide simultaneous measurements of a.c. and d.c. stresses without the use of polarizers or transmission gratings. (C) 1998 Elsevier Science S.A. [References: 13]
机译:干涉测量技术已广泛用于测量一系列工业组件中的应力。在这项工作中,大体积马赫曾德尔干涉仪(MZI)被用作处理干涉仪,而法布里-珀罗干涉仪则作为电子扫描白光干涉传感系统中的传感头。与讨论的其他布置不同,该系统可以同时测量交流电。和d.c.无需使用偏振片或透射光栅即可产生应力。 (C)1998 Elsevier Science S.A. [参考:13]

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