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首页> 外文期刊>Sensors and Actuators, A. Physical >Simultaneous measurement of a.c. and d.c. stresses using a fibre-optic electronically scanned white-light interferometer
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Simultaneous measurement of a.c. and d.c. stresses using a fibre-optic electronically scanned white-light interferometer

机译:同时测量交流电和d.c.光纤电子扫描白光干涉仪产生的应力

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摘要

Interferometric techniques have been used extensively for the measurement of stresses in a range of industrial components. In this work. a hulk-optical Mach-Zehnder interferometer ( MZI ) is employed as a processing interferometer with a Fabry-P6rot interferometer as the sensing head in an electronically scanned white-light interferometric sensing system Unlike other arrangements discussed, this system can provide simultaneous measurements of a.c. and d.c. stresses without the use of polarizers or transmission gratings.# 1998 Elsevier Science S.A.
机译:干涉测量技术已广泛用于测量一系列工业组件中的应力。在这项工作中。在电子扫描白光干涉传感系统中,将大块光学Mach-Zehnder干涉仪(MZI)与Fabry-P6rot干涉仪一起用作处理干涉仪,作为传感头。与讨论的其他布置不同,该系统可以同时测量交流电。和d.c.无需使用偏振片或透射光栅即可产生应力。#1998 Elsevier Science S.A.

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