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Effect of the MgO substitution for CuO on the properties of CaCu_3Ti_4O_(12) ceramics

机译:MgO替代CuO对CaCu_3Ti_4O_(12)陶瓷性能的影响

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In this work, the effect of MgO substitution for CuO on the dielectric properties of CaCu_3Ti_4O_(12) (CCTO) was studied. Ceramic samples of CaCu_(3-x)Mg_xTi_4O_(12) were prepared by a two-step solid-state reaction. The samples were sintered at 600 °C for 2 h and then heated to the final sintering temperature of 1100 °C for 8 h. The lattice parameter of CCTO decreases with Mg substitution from X-ray diffraction (XRD) analysis, since the ionic radius of Mg~(2+) is smaller than that of Cu~(2+). Mg substitution in CCTO causes apparent change in microstructure with much smaller grains due to the grain growth inhibition. The maximum of the dielectric constant can reach to 7.8 x 10~5 at/= 100 Hz for Mg substitution with x = 0.6. The sample with Mg substitution (x > 0.2) yields an apparent semicircle in the impedance spectra. The correlation between the microstructure and dielectric properties suggests the presence of a thin barrier layer forming at the grain boundary.
机译:在这项工作中,研究了MgO替代CuO对CaCu_3Ti_4O_(12)(CCTO)介电性能的影响。通过两步固态反应制备CaCu_(3-x)Mg_xTi_4O_(12)的陶瓷样品。将样品在600°C烧结2 h,然后加热到1100°C的最终烧结温度8 h。 X射线衍射(XRD)分析结果表明,CCTO的晶格参数随着Mg的取代而减小,这是因为Mg〜(2+)的离子半径小于Cu〜(2+)的离子半径。由于晶粒长大的抑制,CCTO中的镁替代会导致晶粒细小得多的微观结构发生明显变化。对于x = 0.6的Mg替代,介电常数的最大值在100 Hz时可达7.8 x 10〜5。具有Mg替代(x> 0.2)的样品在阻抗谱中产生明显的半圆。微观结构和介电性能之间的相关性表明在晶界形成了薄的阻挡层。

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