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首页> 外文期刊>Russian journal of electrochemistry >Localization and chemical state of the third element (Zn, W) in electrolessly deposited nanocrystalline Ni-Zn-P, Ni-W-P and Co-W-P coatings
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Localization and chemical state of the third element (Zn, W) in electrolessly deposited nanocrystalline Ni-Zn-P, Ni-W-P and Co-W-P coatings

机译:化学沉积的纳米晶Ni-Zn-P,Ni-W-P和Co-W-P涂层中第三元素(Zn,W)的定位和化学状态

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摘要

Electroless deposited Ni-P and Co-P coatings, modified by introducing additional elements such as Zn and W are presented. The characteristics alterations of the multicomponent films are reviewed in connection with the particularities of co-deposition of the third metal. Based on the fair correspondence between TEM, microdiffraction and precise XRD analysis it is shown that the structure type and lattice parameters of polycrystalline Ni-Me-P and Co-Me-P films are practically identical to pure Ni and Co metals. No impurity phase is detected by XRD. The location of the third element is determined using TEM with EDS. The conclusion is drawn about the grain boundary segregation of Zn and W along with P. Earlier studies by XPS and AES showed that Zn is partially oxidized, whereas W is in elemental form inside the coatings. Crystallites built of lamellas with thickness within the nanometer scale are observed in Ni-W-P and Co-W-P by TEM.
机译:提出了通过引入其他元素(如Zn和W)进行修饰的化学沉积Ni-P和Co-P涂层。结合第三种金属的共沉积特性,综述了多组分薄膜的特性变化。基于TEM,微衍射和精确的XRD分析之间的合理对应关系,表明多晶Ni-Me-P和Co-Me-P膜的结构类型和晶格参数实际上与纯Ni和Co金属相同。 XRD未检测到杂质相。使用带EDS的TEM确定第三个元素的位置。关于Zn和W以及P的晶界偏析,得出了结论。较早的XPS和AES研究表明,Zn在涂层中部分被氧化,而W以元素形式存在。通过TEM在Ni-W-P和Co-W-P中观察到由厚度为纳米级的薄片构成的微晶。

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