首页> 外文期刊>Optical review >Measurement of Surface Resistivity/Conductivity of Different Organic Thin Films by a Combination of Optical Shearography and Electrochemical Impedance Spectroscopy
【24h】

Measurement of Surface Resistivity/Conductivity of Different Organic Thin Films by a Combination of Optical Shearography and Electrochemical Impedance Spectroscopy

机译:光学剪切与电化学阻抗谱相结合的方法测量不同有机薄膜的表面电阻率/电导率

获取原文
获取原文并翻译 | 示例
           

摘要

Shearography techniques were applied again to measure the surface resistivity/conductivity of different organic thin films on a metallic substrate. The coatings were ACE premium-grey enamel (spray coating), a yellow Acrylic lacquer, and a gold nail polish on a carbon steel substrate. The investigation was focused on determining the in-plane displacement of the coatings by shearography between 20 and 60℃. Then, the alternating current (AC) impedance (resistance) of the same coated samples was determined by electrochemical impedance spectroscopy (EIS) in 3.0% NaCl solution at room temperature. As a result, the proportionality constant (resistivity or conductivity = 1/surface resistivity) between the determined AC impedance and the in-plane displacement was obtained. The obtained resistivity of all investigated coatings, 40.15 × 106-24.6 × 109Ωcm, was found in the insulator range.
机译:再次应用剪切技术,以测量金属基材上不同有机薄膜的表面电阻率/电导率。涂层为ACE特级灰色瓷漆(喷涂涂层),黄色丙烯酸漆和在碳钢基底上的金指甲油。研究的重点是通过20到60℃之间的剪切成像确定涂层在平面内的位移。然后,在室温下,通过电化学阻抗谱(EIS)在3.0%NaCl溶液中测定相同涂层样品的交流(AC)阻抗(电阻)。结果,获得了所确定的AC阻抗和面内位移之间的比例常数(电阻率或电导率= 1 /表面电阻率)。在绝缘子范围内发现所有研究的涂层的电阻率为40.15×106-24.6×109Ωcm。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号