Differential Reflection Photometry of Ultrathin Dielectric Layers on Strongly Absorbing Materials

摘要

The differential reflection of light caused by ultrathin dielectric layers deposited on a strongly absorbing substrate was studied. The dependence of the differential reflection on the angle of incidence and parameters of media was analyzed. The measurement of differential reflection was shown to have a number of potentialities for the determination of parameters of ultrathin layers.