首页> 外文期刊>Optik: Zeitschrift fur Licht- und Elektronenoptik: = Journal for Light-and Electronoptic >Measurement of refractive index homogeneity of parallel optical component
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Measurement of refractive index homogeneity of parallel optical component

机译:平行光学元件折射率均匀性的测量

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摘要

In this paper, we present a method for enhancing the measurement capability of refractive index homogeneity for parallel optical components, which phase-shifting interferometry cannot handle with. With the help of wavelength-modulation phase-shifting interferometry, a series of multiple-surface interference fringes are obtained and analyzed by Fourier transform. Based on the fact that the interference fringe corresponding to each interference cavity has its own variation frequency, the wavefront aberrations induced by each interference cavity are obtained and the refractive index homogeneity is then obtained. It is proved by experiment that the enhanced method can measure the refractive index homogeneity of parallel optical components more accurately and conveniently compared with the traditional measurement approach. Therefore, it will have potential application forwards in optical measurement field.
机译:在本文中,我们提出了一种提高相移干涉法无法处理的平行光学组件的折射率均匀性测量能力的方法。借助于波长调制相移干涉仪,获得了一系列多表面干涉条纹,并通过傅立叶变换进行了分析。基于与每个干涉腔相对应的干涉条纹具有其自身的变化频率的事实,获得了由每个干涉腔引起的波前像差,然后获得了折射率均匀性。实验证明,与传统的测量方法相比,改进的方法可以更准确,方便地测量平行光学元件的折射率均匀性。因此,它将在光学测量领域具有潜在的应用前景。

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