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Tilted fiber Bragg grating sensor interrogation system using a high-resolution silicon-on-insulator arrayed waveguide grating

机译:使用高分辨率绝缘体上硅阵列波导光栅的倾斜式光纤布拉格光栅传感器询问系统

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We report a compact high-resolution arrayed waveguide grating (AWG) interrogator system designed to measure the relative wavelength spacing between two individual resonances of a tilted fiber Bragg grating (TFBG) refractometer. The TFBG refractometer benefits from an internal wavelength and power reference provided by the core mode reflection resonance that can be used to determine cladding mode perturbations with high accuracy. The AWG interrogator is a planar waveguide device fabricated on a silicon-on-insulator platform, having 50 channels with a 0.18 nm wavelength separation and a footprint of 8 mm X 8 mm. By overlaying two adjacent interference orders of the AWG we demonstrate simultaneous monitoring of two widely separated resonances in real time with high wavelength resolution. The standard deviation of the measured wavelength shifts is 1.2 pm, and it is limited by the resolution of the optical spectrum analyzer used for the interrogator calibration measurements.
机译:我们报告了一个紧凑的高分辨率阵列波导光栅(AWG)询问器系统,该系统设计用于测量倾斜光纤布拉格光栅(TFBG)折光仪的两个单独共振之间的相对波长间隔。 TFBG折光仪得益于核心模式反射共振提供的内部波长和功率参考,可用于高精度确定包层模式扰动。 AWG询问器是在绝缘体上硅平台上制造的平面波导器件,具有50个通道,波长间隔为0.18 nm,占地面积为8 mm X 8 mm。通过叠加AWG的两个相邻干扰阶数,我们演示了以高波长分辨率实时同时监视两个相互分离的共振。测得的波长偏移的标准偏差为1.2 pm,并且受用于询问器校准测量的光谱分析仪的分辨率限制。

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