首页> 外文期刊>Optics Communications: A Journal Devoted to the Rapid Publication of Short Contributions in the Field of Optics and Interaction of Light with Matter >A method for measuring two-dimensional refractive index distribution with the total internal reflection of p-polarized light and the phase-shifting interferometry
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A method for measuring two-dimensional refractive index distribution with the total internal reflection of p-polarized light and the phase-shifting interferometry

机译:利用p偏振光的全内反射和相移干涉术测量二维折射率分布的方法

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摘要

Based on the total internal reflection of p-polarized light and the phase-shifting interferometry, an alternative method for measuring the two-dimensional refractive index distribution of a material is presented. The p-polarized light is incident on the boundary between a right-angle prism and a tested material. When the total internal reflection occurs at the boundary, and the p-polarized light has a phase variation. It depends on the refractive index of the tested material. Firstly, the two-dimensional phase variation distribution of the p-polarized light at the boundary is measured by the four-step phase shifting interferometric technique. Then, substituting the data into the special equations derived from Fresnel equations, the two-dimensional refractive index distribution of the tested material can be obtained.
机译:基于P偏振光的全内反射和相移干涉术,提出了一种测量材料二维折射率分布的替代方法。 P偏振光入射在直角棱镜和被测材料之间的边界上。当在边界处发生全内反射时,p偏振光会发生相位变化。它取决于被测材料的折射率。首先,通过四步相移干涉技术测量边界处的p偏振光的二维相位变化分布。然后,将数据代入从菲涅耳方程式导出的特殊方程式中,可以获得被测材料的二维折射率分布。

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