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A method for measuring two-dimensional refractive index distribution by using Fresnel equations and phase-shifting interferometry

机译:菲涅耳方程和相移干涉法测量二维折射率分布的方法

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摘要

Based on Fresnel equations and the phase-shifting interferometry, an alternative method for measuring the two-dimensional refractive index distribution of a material is presented. A linearly polarized light passes through a quarter wave-plate and is incident on the tested material. The reflected light propagates through an analyzer, and then the interference signal can be obtained. The special equations to es-rntimate the phase of the interferometric signal can be derived by using Fresnel equations. Next, the associated two-dimensional phase distribution is measured by the four-step phase-shifting interferometry. Then, the measured data are substituted into the special equations derived previously, and the two-dimensional refractive index distribution of the tested material can be obtained.
机译:基于菲涅尔方程和相移干涉法,提出了一种测量材料二维折射率分布的替代方法。线偏振光穿过四分之一波片,并入射到被测材料上。反射光通过分析仪传播,然后可以获得干涉信号。可以使用菲涅耳方程式推导用于估计干涉信号相位的特殊方程式。接下来,通过四步相移干涉法测量相关的二维相位分布。然后,将测得的数据代入先前导出的特殊方程式中,即可获得被测材料的二维折射率分布。

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