Full-aperture measurement of convex surfaces in interferometric test using holographic test plates

摘要

We demonstrated experimentally a valid method for full-aperture measurement of large convex surfaces in the interferometric optical test using holographic test plates. The method utilizes the strategy of measuring twice with different pinhole determined by illumination system errors. We adopt this method to relax the requirements for illumination optics and computer-generated hologram of the test system when measuring large-aperture convex aspheric. We have designed and fabricated one optical test system with large errors in illumination optics and low fringe frequency in CGH, and tested a 100-mm diameter convex surface with full aperture by measuring it twice with proper pinholes. It is believed that this method can be used to relax the test system and reduce the cost significantly for even larger convex aspheric.